IMAGE INTENSIFICATION IN FIELD-ION MICROSCOPE

[1] RESOLUTION OF ATOMIC STRUCTURE - RECENT ADVANCES IN THEORY AND DEVELOPMENT OF FIELD ION MICROSCOPE [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1963, 14 (08): : 474 - &

[2] DRECHSLER M, 1961, Z ANGEW PHYS, V13, P445

[3] GOMER R, 1961, FIELD EMISSION FIELD, P72

[4] GOOD RH, 1956, HDB PHYSIK, V21, P185

[5] HAINE ME, 1960, ADV EEP, V12, P317

[6] MCLANE SB, 1963, B AM PHYS SOC, V8, P431

[7] MOLLENSTEDT G, 1958, 4 INT C EL MICR BERL, P208

[8] Muller E. W., 1960, ADV ELECTRON, V13, P83, DOI 10.1016/S0065-2539(08)60210-3

[9] NOSENKO BM, 1961, B ACAD ACI USSR PHYS, V25, P314

[10] CURRENT-VOLTAGE CHARACTERISTICS OF HELIUM FIELD-ION MICROSCOPE [J]. PHILOSOPHICAL MAGAZINE, 1963, 8 (88): : 579 - &

[1] RESOLUTION OF ATOMIC STRUCTURE - RECENT ADVANCES IN THEORY AND DEVELOPMENT OF FIELD ION MICROSCOPE [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1963, 14 (08): : 474 - &

[2] DRECHSLER M, 1961, Z ANGEW PHYS, V13, P445

[3] GOMER R, 1961, FIELD EMISSION FIELD, P72

[4] GOOD RH, 1956, HDB PHYSIK, V21, P185

[5] HAINE ME, 1960, ADV EEP, V12, P317

[6] MCLANE SB, 1963, B AM PHYS SOC, V8, P431

[7] MOLLENSTEDT G, 1958, 4 INT C EL MICR BERL, P208

[8] Muller E. W., 1960, ADV ELECTRON, V13, P83, DOI 10.1016/S0065-2539(08)60210-3

[9] NOSENKO BM, 1961, B ACAD ACI USSR PHYS, V25, P314

[10] CURRENT-VOLTAGE CHARACTERISTICS OF HELIUM FIELD-ION MICROSCOPE [J]. PHILOSOPHICAL MAGAZINE, 1963, 8 (88): : 579 - &