QUANTITATIVE-ANALYSIS OF COMPLEX AUGER-SPECTRA BY LEAST-SQUARES FITTING WITH PREFILTERING OF SPECTRA

被引：14

作者：

SEKINE, T

MOGAMI, A

机构：

来源：

SURFACE AND INTERFACE ANALYSIS | 1985年 / 7卷 / 06期

关键词：

D O I：

10.1002/sia.740070607

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：289 / 294

页数：6

共 10 条

[1]

DUC BM, 1981, SCAN ELECTRON MICROS, P301

[2] ANALYSIS OF MATERIALS BY ELECTRON-EXCITED AUGER ELECTRONS [J].

HARRIS, LA .

JOURNAL OF APPLIED PHYSICS, 1968, 39 (03) :1419-&

[3] METHOD OF BACKGROUND DETERMINATION IN QUANTITATIVE AUGER-SPECTROSCOPY [J].

HESSE, R ;

LITTMARK, U ;

STAIB, P .

APPLIED PHYSICS, 1976, 11 (03) :233-239

[4] SMOOTHING + DIFFERENTIATION OF DATA BY SIMPLIFIED LEAST SQUARES PROCEDURES [J].

SAVITZKY, A ;

GOLAY, MJE .

ANALYTICAL CHEMISTRY, 1964, 36 (08) :1627-&

[5]

Schamber F.H., 1977, XRAY FLUORESCENCE AN, P241

[6]

SCHAMBER FH, 1973, 8TH P NAT C EL PROB

[7] QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY AND ELECTRON RANGES [J].

SEAH, MP .

SURFACE SCIENCE, 1972, 32 (03) :703-&

[8]

SEKINE T, 1982, HDB AUGER ELECTRON S

[9] A SECONDARY-ELECTRON EMISSION CORRECTION FOR QUANTITATIVE AUGER YIELD MEASUREMENTS [J].

SICKAFUS, EN .

SURFACE SCIENCE, 1980, 100 (03) :529-540

[10] DECONVOLUTION AND BACKGROUND SUBTRACTION BY LEAST-SQUARES FITTING WITH PRE-FILTERING OF SPECTRA [J].

STATHAM, PJ .

ANALYTICAL CHEMISTRY, 1977, 49 (14) :2149-2154

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