EQUIVALENT LAYERS - ANOTHER WAY TO LOOK AT THEM

被引:13
作者
VANDERLAAN, CJ
FRANKENA, HJ
机构
[1] Faculty of Applied Physics, Delft University of Technology, Delft, 2628 CJ
来源
APPLIED OPTICS | 1995年 / 34卷 / 04期
关键词
D O I
10.1364/AO.34.000681
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We describe the behavior of the equivalent refractive index (or Herpin index) and equivalent phase thickness in relation to the phase thicknesses of the layers in a dielectric stack. This relation is visualized by a diagram that provides insight into the existing solutions for given combinations of the Herpin index and the equivalent phase thickness. Furthermore, it can be used for the explanation of the occurrence of stop bands and of the dispersion of equivalent layer stacks.
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页码:681 / 687
页数:7
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