ON THE USE OF X-RAY-RADIATION TO PROBE LASER CREATED PLASMAS BY REFRACTOMETRY

被引:7
作者
BENATTAR, R [1 ]
GODART, J [1 ]
机构
[1] UNIV PARIS 11,PHYS GAZ & PLASMAS LAB,F-91405 ORSAY,FRANCE
关键词
D O I
10.1016/0030-4018(84)90087-7
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:43 / 50
页数:8
相关论文
共 7 条
[1]  
BENATTAR A, 1983, J APPL PHYS, V54, P609
[2]   EFFECT OF LASER WAVELENGTH AND PULSE DURATION ON LASER-LIGHT ABSORPTION AND BACK REFLECTION [J].
GARBANLABAUNE, C ;
FABRE, E ;
MAX, CE ;
FABBRO, R ;
AMIRANOFF, F ;
VIRMONT, J ;
WEINFELD, M ;
MICHARD, A .
PHYSICAL REVIEW LETTERS, 1982, 48 (15) :1018-1021
[3]  
JEAGLE P, 1979, UNPUB GRECO ILM ANN
[4]  
JEAGLE P, 1981, UNPUB GRECO ILM ANN
[5]  
JEAGLE P, 1980, UNPUB GRECO ILM ANN
[6]   INFRARED SCHLIEREN INTERFEROMETER FOR MEASURING ELECTRON-DENSITY PROFILES [J].
KEILMANN, F .
PLASMA PHYSICS, 1972, 14 (02) :111-&
[7]   X-RAY REFRACTION EFFECT AND DENSITY DETERMINATION OF STEEP-GRADIENT, HIGH-DENSITY PLASMA [J].
MIYANAGA, N ;
KATO, Y ;
YAMANAKA, C .
OPTICS COMMUNICATIONS, 1982, 44 (01) :48-52