RESOLUTION IN LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPY

[1] SIMPLE-MODEL FOR ELECTRON INELASTIC MEAN FREE PATHS - APPLICATION TO CONDENSED ORGANIC MATERIALS [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1982, 28 (03) : 177 - 194

[2] DRESCHER H, 1970, Z ANGEW PHYSIK, V29, P331

[3] Evans R. D., 1955, ATOMIC NUCL, P711

[4] HOWIE A, 1981, 39 ANN P EL MICR SOC, P186

[5] Joy D. C., 1983, Microelectronic Engineering, V1, P103, DOI 10.1016/0167-9317(83)90024-2

[6] Joy D. C., 1984, MICROBEAM ANAL 1984, P81

[7] BEAM INTERACTIONS, CONTRAST AND RESOLUTION IN THE SEM [J]. JOURNAL OF MICROSCOPY-OXFORD, 1984, 136 (NOV): : 241 - 258

[8] CONTRIBUTION OF BACKSCATTERED ELECTRONS TO SECONDARY ELECTRON FORMATION [J]. PHYSICAL REVIEW, 1961, 121 (03): : 681 - &

[9] LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPY [J]. JOURNAL OF MICROSCOPY, 1984, 136 (OCT) : 45 - 68

[10] QUANTITATIVE CHEMICAL-ANALYSIS BY ESCA [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 9 (01) : 29 - 40

[1] SIMPLE-MODEL FOR ELECTRON INELASTIC MEAN FREE PATHS - APPLICATION TO CONDENSED ORGANIC MATERIALS [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1982, 28 (03) : 177 - 194

[2] DRESCHER H, 1970, Z ANGEW PHYSIK, V29, P331

[3] Evans R. D., 1955, ATOMIC NUCL, P711

[4] HOWIE A, 1981, 39 ANN P EL MICR SOC, P186

[5] Joy D. C., 1983, Microelectronic Engineering, V1, P103, DOI 10.1016/0167-9317(83)90024-2

[6] Joy D. C., 1984, MICROBEAM ANAL 1984, P81

[7] BEAM INTERACTIONS, CONTRAST AND RESOLUTION IN THE SEM [J]. JOURNAL OF MICROSCOPY-OXFORD, 1984, 136 (NOV): : 241 - 258

[8] CONTRIBUTION OF BACKSCATTERED ELECTRONS TO SECONDARY ELECTRON FORMATION [J]. PHYSICAL REVIEW, 1961, 121 (03): : 681 - &

[9] LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPY [J]. JOURNAL OF MICROSCOPY, 1984, 136 (OCT) : 45 - 68

[10] QUANTITATIVE CHEMICAL-ANALYSIS BY ESCA [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 9 (01) : 29 - 40