SYNCHROTRON RADIATION-INDUCED X-RAY-EMISSION - SRIXE

被引：1

作者：

KWIATEK, WM

机构：

来源：

ACTA PHYSICA POLONICA A | 1992年 / 82卷 / 02期

关键词：

D O I：

10.12693/APhysPolA.82.263

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The synchrotron radiation induced X-ray emission (SRIXE) technique was found very useful and sensitive for determination of trace elements content and distribution in different types of materials. Due to properties of synchrotron radiation the SRIXE technique became very unique and powerful for trace elements analysis. This paper describes the phenomena related to production of characteristic X-rays and principles of the method. The properties of SRIXE such as minimum detectable limit, spatial resolution, radiation damage, and depth sensitivity are also discussed. Selected applications are given to emphasize the usefulness of the technique.

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页码：263 / 271

页数：9

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