STUDIES OF INTERFACIAL REGIONS BY SUM-FREQUENCY GENERATION WITH A FREE-ELECTRON LASER

被引:12
作者
ELIEL, ER
VANDERHAM, EWM
VREHEN, QHF
THOOFT, GW
BARMENTLO, M
AUERHAMMER, JM
VANDERMEER, AFG
VANAMERSFOORT, PW
机构
[1] PHILIPS RES LABS,5656 AA EINDHOVEN,NETHERLANDS
[2] EURATOM,FOM,INST PLASMA PHYS RIJNHUIZEN,3430 BE NIEUWEGEIN,NETHERLANDS
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1995年 / 60卷 / 02期
关键词
D O I
10.1007/BF01538234
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The use of a Free-Electron Laser (FEL) allows the study of (non)linear optical properties of materials over unsurpassed large spectral intervals. As an example, we report on the use of a FEL as the infrared source in spectroscopic infrared-visible Sum-Frequency Generation (SFG). Employing the extremely wide tunability of the Free-Electron Laser for Infrared eXperiments (FELIX) at Rijnhuizen, we have studied the frequency dependence of the nonlinear susceptibility for sum-frequency generation in gallium phosphide between 20 and 32 mu m in great detail. We have developed a short-pulse visible laser system that is highly synchronous with FELIX thereby creating a two-color setup that can be broadly applied. Resonantly enhanced SFG in alpha-quartz has been used to study the relative timing stability of FELIX and the synchronized picosecond-laser system.
引用
收藏
页码:113 / 119
页数:7
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