A STUDY OF HEAT LEAKS INTO CRYOSTATS DUE TO ELECTRICAL LEADS

被引：13

作者：

MATTHEWS, PW

KHOO, TL

NEUFELD, PD

机构：

来源：

关键词：

D O I：

10.1016/0011-2275(65)90060-3

中图分类号：

O414.1 [热力学];

学科分类号：

摘要：

引用

页码：213 / &

共 10 条

[1] A COPPER RESISTANCE TEMPERATURE SCALE [J].

DAUPHINEE, TM ;

PRESTONTHOMAS, H .

[2]

FOURNET G, 1964, CR HEBD ACAD SCI, V258, P103

[3]

FOURNET G, 1963, CR HEBD ACAD SCI, V257, P4153

[4] OPTIMUM INPUT LEADS FOR CRYOGENIC APPARATUS [J].

MCFEE, R .

[5]

MENDOZA E, 1951, PHILOS MAG, V42, P291

[6] LOW-TEMPERATURE THERMAL CONDUCTIVITY OF SOME COMMERCIAL COPPERS [J].

POWELL, RL ;

RODER, HM ;

ROGERS, WM .

[7] EVAPORATION OF HELIUM I DUE TO CURRENT-CARRYING LEADS [J].

SOBOL, H ;

MCNICHOL, JJ .

[8] THE MEAN FREE PATH OF ELECTRONS IN METALS [J].

SONDHEIMER, EH .

[9]

W Mercouroff, 1963, CRYOGENICS, V3, P171

[10]

Williams J.E.C., 1963, CRYOGENICS, V3, P234