DIVERGING CHARACTERISTIC LENGTHS AT CRITICAL DISORDER IN THIN-FILM SUPERCONDUCTORS

被引:46
作者
HEBARD, AF
PAALANEN, MA
机构
关键词
D O I
10.1103/PhysRevLett.54.2155
中图分类号
O4 [物理学];
学科分类号
0702 ;
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页码:2155 / 2158
页数:4
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