DETECTION OF 2-CHLOROETHYL ETHYL SULFIDE END SULFONIUM ION DEGRADATION PRODUCTS ON ENVIRONMENTAL SURFACES DOING STATIC SIMS

被引:23
作者
GROENEWOLD, GS
INGRAM, JC
APPELHANS, AD
DELMORE, JE
DAHL, DA
机构
[1] Idaho National Engineering Laboratory, Idaho Falls, Idaho 83415-2208
关键词
D O I
10.1021/es00008a033
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
2-Chloroethyl ethyl sulfide (CEES) is a simultant for the chemical warfare agent bis(2-chloroethyl)sulfide (also known as HD or mustard), and both molecules undergo hydrolysis and subsequent condensation in aqueous solution to form stable sulfonium ions. The sulfonium ions derived from CEES are directly detected on quartzic surfaces using static SIMS instrumentation, which employs a molecular ReO4- (250 D) primary ion and pulsed secondary ion extraction. Pulsed extraction mitigates surface charging, and the ReO4- primary particle is efficient at sputtering molecular surface species into the gas phase. CEES eliminates Cl- to form an ethyl thiiranium intermediate, which is susceptible to nucleophilic attack by water and methanol to form 2-hydroxyethyl ethyl sulfide and 2-methoxyethyl ethyl sulfide. These two products and unhydrolyzed CEES also function as nucleophiles that condense with the ethyl thiiranium intermediate, resulting in the formation of sulfonium ion aggregates that are observable using SIMS. The previously unreported methoxy-substituted sulfonium ion suggests that a variety of derivatives are possible if different nucleophiles are present in the vicinity of the ethyl thiiranium intermediate. This work demonstrates that the sulfonium ion aggregates are stable on mineral surfaces and also demonstrates the potential value of SIMS for the detection of unanticipated ionic species in monitoring applications where mustard and its degradation products are suspected.
引用
收藏
页码:2107 / 2111
页数:5
相关论文
共 20 条
[1]   COMPARISON OF POLYATOMIC AND ATOMIC PRIMARY BEAMS FOR SECONDARY ION MASS-SPECTROMETRY OF ORGANICS [J].
APPELHANS, AD ;
DELMORE, JE .
ANALYTICAL CHEMISTRY, 1989, 61 (10) :1087-1093
[2]   NEUTRALIZATION OF SAMPLE CHARGING IN SECONDARY ION MASS-SPECTROMETRY VIA A PULSED EXTRACTION FIELD [J].
APPELHANS, AD ;
DAHL, DA ;
DELMORE, JE .
ANALYTICAL CHEMISTRY, 1990, 62 (15) :1679-1686
[3]  
APPLEHANS AD, 1994, PITTCON 94
[4]   INVESTIGATION OF SURFACE CHARGING OF INSULATING MATERIALS DUE TO SECONDARY PARTICLE-EMISSION USING A NEW DUAL BEAM INSTRUMENT [J].
BECK, ST ;
APPELHANS, AD ;
DELMORE, JE ;
DAHL, DA .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1992, 120 (1-2) :129-155
[5]   SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS) [J].
BENNINGHOVEN, A .
SURFACE SCIENCE, 1973, 35 (01) :427-457
[6]  
BLAIN MG, 1989, J PHYS, V50
[7]   INTERACTION OF ION-BEAMS WITH POLYMERS, WITH PARTICULAR REFERENCE TO SIMS [J].
BRIGGS, D ;
HEARN, MJ .
VACUUM, 1986, 36 (11-12) :1005-1010
[8]  
BUSCH K L, 1992, Journal of Planar Chromatography - Modern TLC, V5, P9
[9]   DETECTION OF AGRICULTURAL CHEMICAL RESIDUES ON PLANT LEAF SURFACES WITH SECONDARY ION MASS-SPECTROMETRY [J].
DELMORE, JE ;
APPELHANS, AD .
BIOLOGICAL MASS SPECTROMETRY, 1991, 20 (05) :237-246
[10]   TUBE ION-SOURCE FOR THE STUDY OF CHEMICAL EFFECTS IN SURFACE-IONIZATION [J].
DELMORE, JE ;
APPELHANS, AD ;
PETERSON, ES .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1991, 108 (2-3) :179-187