MEASUREMENT OF ION FLUX EMANATING FROM OXIDE COATED EMISSION FILAMENTS IN SIEMENS ELECTRON MICROSCOPE

被引：9

作者：

PARSONS, JR

HOWE, LM

机构：

来源：

JOURNAL OF SCIENTIFIC INSTRUMENTS | 1964年 / 41卷 / 12期

关键词：

D O I：

10.1088/0950-7671/41/12/315

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：773 / &

相关论文

共 5 条

[1] DIRECT OBSERVATION OF DISAPPEARANCE + COLLAPSE OF STACKING-FAULT TETRAHEDRA IN GOLD FOILS DURING ION BOMBARDMENT IN ELECTRON MICROSCOPE ( LOW TO ROOM TEMPERATURE E )
HOWE, LM
MCGURN, JF
[J]. APPLIED PHYSICS LETTERS, 1964, 4 (06) : 99 - &
[2] DIRECT OBSERVATION OF RADIATION DAMAGE PRODUCED IN COPPER BELOW 30-DEGREES-K DURING ION BOMBARDMENT IN THE ELECTRON MICROSCOPE
HOWE, LM
GILBERT, RW
PIERCY, GR
[J]. APPLIED PHYSICS LETTERS, 1963, 3 (08) : 125 - 127
[3] MENTER JW, 1962, PROPERTIES REACTOR M, P346
[4] ION DAMAGE TO METAL FILMS INSIDE AN ELECTRON MICROSCOPE
PASHLEY, DW
PRESLAND, AEB
[J]. PHILOSOPHICAL MAGAZINE, 1961, 6 (68): : 1003 - &
[5] SURPLICE NA, 1961, BRIT J APPL PHYS, V12, P220