SURFACE PHOTO-VOLTAGE MEASURED CAPACITANCE - APPLICATION TO SEMICONDUCTOR ELECTROLYTE SYSTEM

被引：42

作者：

KAMIENIECKI, E

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1983年 / 54卷 / 11期

关键词：

D O I：

10.1063/1.331876

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：6481 / 6487

页数：7

共 16 条

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