LOT SIZES AND SETUP FREQUENCY WITH LEARNING IN SETUPS AND PROCESS QUALITY

[1] Adler G. L., 1974, AIIE T, V6, P14, DOI DOI 10.1080/05695557408974927

[2] CHAND S, 1987, DYNAMIC LOT SIZING M

[3] FISK JC, 1982, AIIE T, V14, P257

[4] HALL RW, 1983, 0 INVENTORIES

[5] KARWAN KR, 1988, NAV RES LOG, V35, P159, DOI 10.1002/1520-6750(198804)35:2<159::AID-NAV3220350202>3.0.CO

[6] 2-1

[7] Keachie EC, 1966, MANAGE SCI, V13, P102, DOI DOI 10.1287/MNSC.13.2.B102

[8] PARAMETER-ESTIMATION FOR THE EOQ LOT-SIZE MODEL - MINIMAX AND EXPECTED VALUE CHOICES [J]. NAVAL RESEARCH LOGISTICS, 1983, 30 (02) : 367 - 376

[9] PORTEUS EL, 1984, 743 STANF U GRAD SCH

[10] SCHONBERGER RICHARD J., 1982, JAPANESE MANUFACTURI

[1] Adler G. L., 1974, AIIE T, V6, P14, DOI DOI 10.1080/05695557408974927

[2] CHAND S, 1987, DYNAMIC LOT SIZING M

[3] FISK JC, 1982, AIIE T, V14, P257

[4] HALL RW, 1983, 0 INVENTORIES

[5] KARWAN KR, 1988, NAV RES LOG, V35, P159, DOI 10.1002/1520-6750(198804)35:2<159::AID-NAV3220350202>3.0.CO

[6] 2-1

[7] Keachie EC, 1966, MANAGE SCI, V13, P102, DOI DOI 10.1287/MNSC.13.2.B102

[8] PARAMETER-ESTIMATION FOR THE EOQ LOT-SIZE MODEL - MINIMAX AND EXPECTED VALUE CHOICES [J]. NAVAL RESEARCH LOGISTICS, 1983, 30 (02) : 367 - 376

[9] PORTEUS EL, 1984, 743 STANF U GRAD SCH

[10] SCHONBERGER RICHARD J., 1982, JAPANESE MANUFACTURI