USE OF RATIO-RECORDING INTERFEROMETRY FOR MEASUREMENT OF INFRARED-EMISSION SPECTRA - APPLICATIONS TO OXIDE-FILMS ON COPPER SURFACES

被引:28
作者
KEMBER, D [1 ]
SHEPPARD, N [1 ]
机构
[1] UNIV E ANGLIA,SCH CHEM SCI,NORWICH NR4 7TJ,ENGLAND
关键词
D O I
10.1366/000370275774455680
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:496 / 500
页数:5
相关论文
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