X-RAY AND NEUTRON REFLECTIVITY ANALYSIS OF THIN-FILMS AND SUPERLATTICES

被引：106

作者：

ZABEL, H

机构：

[1] Fakultät für Physik und Astronomie, Institut für Experimentalphysik/Festkörperphysik, Ruhr-Universität Bochum, Bochum

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1994年 / 58卷 / 03期

关键词：

D O I：

10.1007/BF00324371

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

X-ray and neutron reflectivity measurements provide a wealth of information on thickness and interfacial properties on the nanometer scale. This method is therefore well suited for the study of nano-structured thin films and superlattices. Neutrons provide a different contrast between the elements than X-rays and, in addition, are sensitive to the magnetization in the sample. Using polarized neutrons, magnetic as well as chemical profiles can be probed. In this review a basic introduction into the theory of X-ray and neutron reflectivity is provided along with some recent examples including the oxidation of Fe films and the structural and magnetic properties of Co/Cu superlattices.

引用

页码：159 / 168

页数：10

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