THERMAL-OXIDATION OF THE SILICIDES COSI2, CRSI2, NISI2, PTSI, TISI2 AND ZRSI2

被引:65
作者
STRYDOM, WJ
LOMBAARD, JC
PRETORIUS, R
机构
[1] UNIV STELLENBOSCH,DEPT PHYS,DIV SOLID STATE,STELLENBOSCH 7600,SOUTH AFRICA
[2] CSIR,CTR NATL ACCELERATOR,VAN DE GRAAFF GRP,DIV ION SOLID INTERACT,FAURE 7131,SOUTH AFRICA
关键词
D O I
10.1016/0040-6090(85)90142-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
ELECTRON DEVICE MANUFACTURE
引用
收藏
页码:215 / 231
页数:17
相关论文
共 30 条
[1]   INTERFACE EFFECTS IN THE FORMATION OF SILICON-OXIDE ON METAL SILICIDE LAYERS OVER SILICON SUBSTRATES [J].
BAGLIN, JEE ;
DHEURLE, FM ;
PETERSSON, CS .
JOURNAL OF APPLIED PHYSICS, 1983, 54 (04) :1849-1854
[2]   THERMAL-OXIDATION OF TRANSITION-METAL SILICIDES - THE ROLE OF MASS-TRANSPORT [J].
BARTUR, M .
THIN SOLID FILMS, 1983, 107 (01) :55-65
[3]   THERMAL-OXIDATION OF NICKEL DISILICIDE [J].
BARTUR, M ;
NICOLET, MA .
APPLIED PHYSICS LETTERS, 1982, 40 (02) :175-177
[4]   THERMAL-OXIDATION OF COBALT DISILICIDE [J].
BARTUR, M ;
NICOLET, MA .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1982, 29 (02) :69-70
[5]   MARKER EXPERIMENTS FOR DIFFUSION IN THE SILICIDE DURING OXIDATION OF PDSI, PD2SI, COSI2, AND NISI2 FILMS ON [SI] [J].
BARTUR, M ;
NICOLET, MA .
JOURNAL OF APPLIED PHYSICS, 1983, 54 (09) :5404-5405
[6]   HIGH-TEMPERATURE OXIDATION .2. MOLYBDENUM SILICIDES [J].
BERKOWIT.JB .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1965, 112 (06) :583-&
[7]   CO2SI, CRSI2, ZRSI2 AND TISI2 FORMATION STUDIED BY A RADIOACTIVE SI-31 MARKER TECHNIQUE [J].
BOTHA, AP ;
PRETORIUS, R .
THIN SOLID FILMS, 1982, 93 (1-2) :127-133
[8]   OXIDATION MECHANISMS IN TISI2 FILMS ON SINGLE SILICON SUBSTRATES [J].
CHEN, JR ;
HOUNG, MP ;
HSIUNG, SK ;
LIU, YC .
APPLIED PHYSICS LETTERS, 1980, 37 (09) :824-826
[9]   INVESTIGATION ON TISI2 THIN-FILM OXIDATION BY RADIOACTIVE-TRACER TECHNIQUE [J].
CHEN, JR ;
LIU, YC ;
CHU, SD .
APPLIED PHYSICS LETTERS, 1982, 40 (03) :263-265
[10]  
Chu WK., 1978, BACKSCATTERING SPECT