DIELECTRIC MATERIAL MEASUREMENT OF THIN SAMPLES AT MILLIMETER WAVELENGTHS

被引：18

作者：

DUDECK, KE ^{[1
]}

BUCKLEY, LJ ^{[1
]}

机构：

[1] USN,CTR AIR DEV,WARMINSTER,PA 18974

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1992年 / 41卷 / 05期

关键词：

D O I：

10.1109/19.177352

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Complex permittivity and permeability measurements at millimeter wave frequencies of thin samples (0.12 to 1.0 mm) were obtained. The methodology and considerations for making automated waveguide material measurements of thin samples in the 26.5 to 40 GHz (R-Band) frequency range are described herein. Measurement results for various dielectric materials are included.

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收藏

页码：723 / 725

页数：3

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