NOVEL TECHNIQUE TO MEASURE THE MICROWAVE RESPONSE OF HIGH-TC SUPERCONDUCTORS BETWEEN 4.2-K AND 200-K

被引：111

作者：

SRIDHAR, S

KENNEDY, WL

机构：

来源：

关键词：

D O I：

10.1063/1.1139881

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：531 / 536

页数：6

共 15 条

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