ELECTRON-IMPACT IONIZATION AND ENERGY-LOSS OF 27-MEV U-XE-35+ INCIDENT IONS CHANNELED IN SILICON

被引：20

作者：

ANDRIAMONJE, S

ANNE, R

FARIA, NVD

CHEVALLIER, M

COHEN, C

DURAL, J

GAILLARD, MJ

GENRE, R

HAGEALI, M

KIRSCH, R

LHOIR, A

FARIZONMAZUY, B

MORY, J

MOULIN, J

POIZAT, JC

QUERE, Y

REMILLIEUX, J

SCHMAUS, D

TOULEMONDE, M

机构：

[1] INST NATL PHYS NUCL & PHYS PARTICULES,F-33170 GRADIGNAN,FRANCE

[2] GRAND ACCELERATEUR NATL IONS LOURDS,F-14021 CAEN,FRANCE

[3] UNIV LYON 1,INST PHYS NUCL LYON,F-69622 VILLEURBANNE,FRANCE

[4] UNIV LYON 1,INST NATL PHYS NUCL & PHYS PARTICULES,F-69622 VILLEURBANNE,FRANCE

[5] ECOLE POLYTECH,SOLIDES IRRADIES LAB,F-91128 PALAISEAU,FRANCE

[6] ECOLE NORM SUPER,PHYS SOLIDES GRP,F-75251 PARIS 05,FRANCE

[7] CTR INTERDISCIPLINAIRE RECH IONS LORDS,F-14040 CAEN,FRANCE

[8] CTR RECH NUCL,PHYS APPL SEMICOND,GRP,F-67037 STRASBOURG,FRANCE

[9] INST NATL PHYS NUCL & PHYS PARTICULES,F-67037 STRASBOURG,FRANCE

来源：

PHYSICAL REVIEW LETTERS | 1989年 / 63卷 / 18期

关键词：

D O I：

10.1103/PhysRevLett.63.1930

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1930 / 1930

页数：1

共 14 条

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