EXAMINATION OF THE CUTICULAR SURFACES OF FRESH DELICATE LEAVES AND PETALS WITH A SCANNING ELECTRON-MICROSCOPE - A CONTROL FOR ARTIFACTS

被引：10

作者：

EVELING, DW

机构：

来源：

NEW PHYTOLOGIST | 1984年 / 96卷 / 02期

关键词：

D O I：

10.1111/j.1469-8137.1984.tb03559.x

中图分类号：

Q94 [植物学];

学科分类号：

071001 ;

摘要：

引用

页码：229 / 237

页数：9

共 12 条

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BAKER, EA ;

PARSONS, E .

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[2]

Echlin P., 1971, SCANNING ELECTRON MI, P307

[3] AN EVALUATION OF METHODS FOR PREPARING EASILY DAMAGED CUTICULAR SURFACES OF PLANTS FOR SCANNING ELECTRON-MICROSCOPY [J].

EVELING, DW ;

MCCALL, RD .

JOURNAL OF MICROSCOPY, 1983, 129 (FEB) :113-122

[4]

EVELING DW, 1967, THESIS U LONDON

[5]

HART CA, 1979, PESTIC SCI, V10, P341, DOI 10.1002/ps.2780100410

[6]

Hayat MA, 1978, INTRO BIOL SCANNING

[7]

HOLLOWAY PJ, 1974, PRINCIPLES TECHNIQUE, V1, P181

[8] CRYSTALLINE-STRUCTURE OF PLANT EPICUTICULAR WAXES DEMONSTRATED BY CRYOSTAGE SCANNING ELECTRON-MICROSCOPY [J].

JEFFREE, CE ;

SANDFORD, AP .

NEW PHYTOLOGIST, 1982, 91 (03) :549-559

[9]

LEDBETTER MC, 1976, SCANNING ELECTRON MI, V2, P453

[10] COMPARATIVE SURVEY OF TECHNIQUES FOR PREPARING PLANT SURFACES FOR SCANNING ELECTRON-MICROSCOPE [J].

PARSONS, E ;

BOLE, B ;

HALL, DJ ;

THOMAS, WDE .

JOURNAL OF MICROSCOPY-OXFORD, 1974, 101 (MAY) :59-75

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