DETERMINATION OF CHRYSOTILE ASBESTOS IN BUILDING-MATERIALS BY X-RAY-DIFFRACTOMETRY

被引：12

作者：

DUNN, HW ^{[1
]}

STEWART, JH ^{[1
]}

机构：

[1] OAK RIDGE NATL LAB, DIV ANALYT CHEM, POB X, OAK RIDGE, TN 37830 USA

来源：

ANALYTICAL CHEMISTRY | 1982年 / 54卷 / 07期

关键词：

D O I：

10.1021/ac00244a025

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1122 / 1125

页数：4

共 17 条

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[8] DETERMINATION OF MICROGRAM QUANTITIES OF ASBESTOS BY X-RAY-DIFFRACTION - CHRYSOTILE IN THIN DUST LAYERS OF MATRIX MATERIAL [J].

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