CRYSTAL ASSESSMENT BY X-RAY TOPOGRAPHY USING SYNCHROTRON RADIATION

被引：32

作者：

TANNER, BK ^{[1
]}

机构：

[1] UNIV DURHAM,DEPT PHYS,DURHAM DH1 3LE,ENGLAND

来源：

PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS | 1977年 / 1卷 / 01期

关键词：

D O I：

10.1016/0146-3535(77)90004-1

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：23 / 56

页数：34

共 53 条

[1] ELECTRON-DISTRIBUTION IN SILICON .1. EXPERIMENT [J].

ALDRED, PJE ;

HART, M .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1973, 332 (1589) :223-+

[2]

[Anonymous], 1976, XRAY DIFFRACTION TOP

[3] DETERMINATION OF ANGLES BETWEEN BLOCKS FROM TOPOGRAPHS OBTAINED BY SCHULZ METHOD [J].

ARISTOV, VV ;

SHULAKOV, EV .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1975, 8 (AUG1) :445-451

[4]

Authier A., 1970, Modern diffraction and imaging techniques in material science, P481

[5] LANG TOPOGRAPHY OF DISLOCATIONS IN CADMIUM [J].

BADRICK, AST ;

PUTTICK, KE .

PHILOSOPHICAL MAGAZINE, 1971, 23 (183) :585-&

[6]

BARRETT CS, 1945, T AM I MIN MET ENG, V161, P15

[7]

BEAUMONT JH, 1974, J PHYS E, V7, P832

[8] Roentgenographic methods for investigating lattice imperfections in crystals [J].

Berg, W .

NATURWISSENSCHAFTEN, 1931, 19 :391-396

[9]

BOND WL, 1952, AM MINERAL, V37, P622

[10] RONTGENOGRAPHISCHE ABBILDUNG DES VERZERRUNGSFELDES EINZELNER VERSETZUNGEN IN GERMANIUM-EINKRISTALLEN [J].

BONSE, U ;

KAPPLER, E .

ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1958, 13 (04) :348-&

← 1 2 3 4 5 6 →