STRUCTURAL CHARACTERIZATION OF STEPPED GA/SI(112) SURFACES

被引：12

作者：

YATER, JE

SHIH, A

IDZERDA, YU

机构：

[1] Naval Research Laboratory, Washington

来源：

PHYSICAL REVIEW B | 1995年 / 51卷 / 11期

关键词：

D O I：

10.1103/PhysRevB.51.7365

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Low-energy Ga angle-resolved Auger-electron-spectroscopy measurements for Ga adsorption on the stepped Si(112) surface taken along and across the step direction are found to provide complementary information about the Ga array and the adsorption-site conditions. Comparison of the two measured spectra with calculated spectra identifies the adsorption-site position of the Ga adatoms to be at the step-edge site of the nonprimitive Si(112) lattice, with a vacancy at every sixth site along the step-edge direction. © 1995 The American Physical Society.

引用

收藏

页码：7365 / 7368

页数：4

相关论文

共 24 条

[1] QUASI-PERIODIC NANOSCALE FACETING OF HIGH-INDEX SI SURFACES [J].

BASKI, AA ;

WHITMAN, LJ .

PHYSICAL REVIEW LETTERS, 1995, 74 (06) :956-959

[2] STEP-FLOW GROWTH ON STRAINED SURFACES - (AL,GA)SB TILTED SUPERLATTICES [J].

CHALMERS, SA ;

KROEMER, H ;

GOSSARD, AC .

APPLIED PHYSICS LETTERS, 1990, 57 (17) :1751-1753

[3] EPITAXIAL FILM CRYSTALLOGRAPHY BY HIGH-ENERGY AUGER AND X-RAY PHOTOELECTRON DIFFRACTION [J].

CHAMBERS, SA .

ADVANCES IN PHYSICS, 1991, 40 (04) :357-415

[4] MAGNETISM OF VICINAL SURFACES OF VANADIUM [J].

DREYSSE, H ;

VEGA, A ;

DEMANGEAT, C ;

BALBAS, LC .

EUROPHYSICS LETTERS, 1994, 27 (02) :165-170

[5] X-RAY PHOTOELECTRON AND AUGER-ELECTRON FORWARD SCATTERING - A NEW TOOL FOR SURFACE CRYSTALLOGRAPHY [J].

EGELHOFF, WF .

CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES, 1990, 16 (03) :213-235

[6]

FADLEY CS, 1990, SYNCHROTRON RAD RES

[7] FINAL-STATE EFFECTS IN PHOTOELECTRON DIFFRACTION [J].

FRIEDMAN, DJ ;

FADLEY, CS .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1990, 51 :689-700

[8] DIRECT PHOTOELECTRON-DIFFRACTION METHOD FOR ADSORBATE STRUCTURAL DETERMINATIONS [J].

FRITZSCHE, V ;

WOODRUFF, DP .

PHYSICAL REVIEW B, 1992, 46 (24) :16128-16134

[9] INCIDENT-BEAM EFFECTS IN ELECTRON-STIMULATED AUGER-ELECTRON DIFFRACTION [J].

GAO, Y ;

CAO, JM .

PHYSICAL REVIEW B, 1991, 43 (12) :9692-9699

[10] STRUCTURAL CHARACTERIZATION BY LOW-ENERGY AUGER-ELECTRON AND PHOTOELECTRON SCATTERING [J].

IDZERDA, YU ;

RAMAKER, DE .

PHYSICAL REVIEW LETTERS, 1992, 69 (13) :1943-1946