SPECTRAL DEPENDENCE OF PHOTORESPONSE IN MIM STRUCTURES - INFLUENCE OF ELECTRODE THICKNESS

被引：22

作者：

GUNDLACH, KH ^{[1
]}

KADLEC, J ^{[1
]}

机构：

[1] MAX PLANCK INST PHYS & ASTROPHYS,ABT NUMER RECHENMASCHINEN,8 MUNICH,FED REP GER

来源：

THIN SOLID FILMS | 1975年 / 28卷 / 01期

关键词：

D O I：

10.1016/0040-6090(75)90279-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：107 / 117

页数：11

共 24 条

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[9]

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[10] SPACE-CHARGE DEPENDENCE OF BARRIER HEIGHT ON INSULATOR THICKNESS IN AL-(AL-OXIDE)-AL SANDWICHES [J].

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