THICKNESS AND OPTICAL PROPERTIES OF FILMS OF ANODIC ALUMINIUM OXIDE

[1] DETERMINATION OF REFRACTIVE INDEX AND THICKNESS OF OXIDE FILMS ON ANODIZED ZIRCONIUM FROM TRANSMISSION INTERFERENCE MEASUREMENTS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1965, 112 (04) : 388 - &

[2] THE GROWTH OF BARRIER OXIDE FILMS ON ALUMINUM [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1959, 106 (08) : 643 - 646

[3] STRESSES IN ANODIC FILMS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1963, 110 (12) : 1289 - 1291

[4] OPTICAL CONSTANTS OF ALUMINIUM OXIDE FROM 12.0 TO 24.4 EV [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1965, 16 (07): : 927 - &

[5] ON THE PREPARATION OF HARD OXIDE FILMS WITH PRECISELY CONTROLLED THICKNESS ON EVAPORATED ALUMINUM MIRRORS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1949, 39 (07) : 532 - 540

[6] UBER DIE DICKE UND DIE DISPERSION DER BRECHZAHL DUNNER ALUMINIUMOXYDSCHICHTEN [J]. ZEITSCHRIFT FUR PHYSIK, 1956, 144 (1-3): : 296 - 310

[7] ULTRAVIOLET REFLECTANCE OF AL2O3, SIO2 AND BEO [J]. SOLID STATE COMMUNICATIONS, 1964, 2 (09) : 269 - 272

[8] THE THEORY OF THE FORMATION OF PROTECTIVE OXIDE FILMS ON METALS .3. [J]. TRANSACTIONS OF THE FARADAY SOCIETY, 1947, 43 (07): : 429 - 434

[9] NAGASE K, 1953, MEM I SCIENT IND RES, V10, P66

[10] STUDIES OF THE ANODIC BEHAVIOR OF ALUMINUM .2. COULOMETRY OF BARRIER LAYER PRODUCTION [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1958, 105 (09) : 498 - 502

[1] DETERMINATION OF REFRACTIVE INDEX AND THICKNESS OF OXIDE FILMS ON ANODIZED ZIRCONIUM FROM TRANSMISSION INTERFERENCE MEASUREMENTS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1965, 112 (04) : 388 - &

[2] THE GROWTH OF BARRIER OXIDE FILMS ON ALUMINUM [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1959, 106 (08) : 643 - 646

[3] STRESSES IN ANODIC FILMS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1963, 110 (12) : 1289 - 1291

[4] OPTICAL CONSTANTS OF ALUMINIUM OXIDE FROM 12.0 TO 24.4 EV [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1965, 16 (07): : 927 - &

[5] ON THE PREPARATION OF HARD OXIDE FILMS WITH PRECISELY CONTROLLED THICKNESS ON EVAPORATED ALUMINUM MIRRORS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1949, 39 (07) : 532 - 540

[6] UBER DIE DICKE UND DIE DISPERSION DER BRECHZAHL DUNNER ALUMINIUMOXYDSCHICHTEN [J]. ZEITSCHRIFT FUR PHYSIK, 1956, 144 (1-3): : 296 - 310

[7] ULTRAVIOLET REFLECTANCE OF AL2O3, SIO2 AND BEO [J]. SOLID STATE COMMUNICATIONS, 1964, 2 (09) : 269 - 272

[8] THE THEORY OF THE FORMATION OF PROTECTIVE OXIDE FILMS ON METALS .3. [J]. TRANSACTIONS OF THE FARADAY SOCIETY, 1947, 43 (07): : 429 - 434

[9] NAGASE K, 1953, MEM I SCIENT IND RES, V10, P66

[10] STUDIES OF THE ANODIC BEHAVIOR OF ALUMINUM .2. COULOMETRY OF BARRIER LAYER PRODUCTION [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1958, 105 (09) : 498 - 502