A SIMPLE METHOD OF ABSORPTION AND DECAY CORRECTION IN INTENSITIES MEASURED BY AREA-DETECTOR X-RAY DIFFRACTOMETER

被引：6

作者：

TAKUSAGAWA, F

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1987年 / 20卷

关键词：

D O I：

10.1107/S0021889887086771

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

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收藏

页码：243 / 245

页数：3

相关论文

共 5 条

[1] STATISTICAL EVALUATION OF ABSORPTION [J].

KATAYAMA, C ;

SAKABE, N ;

SAKABE, K .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1972, 28 (03) :293-&

[2] A METHOD OF ABSORPTION CORRECTION BY X-RAY INTENSITY MEASUREMENTS [J].

KOPFMANN, G ;

HUBER, R .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :348-&

[3] SEMIEMPIRICAL ABSORPTION-CORRECTION TECHNIQUE FOR SYMMETRIC CRYSTALS IN SINGLE-CRYSTAL X-RAY CRYSTALLOGRAPHY .1 [J].

LEE, B ;

RUBLE, JR .

ACTA CRYSTALLOGRAPHICA SECTION A, 1977, 33 (JUL1) :629-637

[4] A SEMI-EMPIRICAL METHOD OF ABSORPTION CORRECTION [J].

NORTH, ACT ;

PHILLIPS, DC ;

MATHEWS, FS .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :351-&

[5] ELECTRONIC STATIONARY PICTURE METHOD FOR HIGH-SPEED MEASUREMENT OF REFLECTION INTENSITIES FROM CRYSTALS WITH LARGE UNIT CELLS [J].

XUONG, NH ;

FREER, ST ;

HAMLIN, R ;

NIELSEN, C ;

VERNON, W .

ACTA CRYSTALLOGRAPHICA SECTION A, 1978, 34 (MAR) :289-296