DETECTION LIMITS IN ELEMENTAL DISTRIBUTION IMAGES PRODUCED BY ENERGY-FILTERING TEM - CASE-STUDY OF GRAIN-BOUNDARIES IN SI3N4

被引:63
作者
BERGER, A
MAYER, J
KOHL, H
机构
[1] MAX PLANCK INST MET RES,INST WERKSTOFFWISSENSCH,D-70174 STUTTGART,GERMANY
[2] UNIV MUNSTER,INST PHYS,D-48149 MUNSTER,GERMANY
关键词
D O I
10.1016/0304-3991(94)90084-1
中图分类号
TH742 [显微镜];
学科分类号
摘要
Using an energy filtering transmission electron microscope (EFTEM) we have investigated the detection limits of elemental distribution images obtained by electron spectroscopic imaging (ESI). As a model system we have chosen the amorphous grain boundary films in sintered Si3N4 ceramics. The analyzed films consist of SiO2 with a thickness between 0.7 and 1.5 nm corresponding roughly to 2-5 monolayers of oxygen. The experimental results are compared with theoretical predictions. Imaging conditions yielding optimum detectability are determined. The detection limit is discussed quantitatively.
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页码:101 / 112
页数:12
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