WEAR-RESISTANCE OF IRON-OXIDE THIN-FILMS

被引：4

作者：

CHEN, MM ^{[1
]}

LIN, J ^{[1
]}

WU, TW ^{[1
]}

CASTILLO, G ^{[1
]}

机构：

[1] IBM CORP, INST MAGNET RECORDING, SAN JOSE, CA 95120 USA

来源：

JOURNAL OF APPLIED PHYSICS | 1988年 / 63卷 / 08期

关键词：

D O I：

10.1063/1.340810

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3275 / 3277

页数：3

共 11 条

[1]

CHEN MM, IN PRESS IEEE T MAGN

[2]

HATTORI S, 1982, REV ELEC COMMUN LAB, V30, P24

[3] THE MICROSTRUCTURE OF IRON-OXIDE THIN-FILMS [J].

HWANG, CG ;

CHEN, MM ;

CASTILLO, G .

JOURNAL OF APPLIED PHYSICS, 1988, 63 (08) :3272-3274

[4]

KIMACHI Y, IN PRESS IEEE T MAGN

[5]

MIYAMOTO T, IN PRESS IEEE T MAGN

[6]

MIYAMOTO T, 1985, MR85411

[7]

OHTA S, 1984, UNPUB NATIONAL CONVE

[8] SIGNAL-TO-NOISE RATIO STUDIES ON GAMMA-FE2O3 THIN-FILM RECORDING DISKS [J].

TERADA, A ;

ISHII, O ;

OHTA, S ;

NAKAGAWA, T .

IEEE TRANSACTIONS ON MAGNETICS, 1983, 19 (01) :7-12

[9] PRESSURE-INDUCED SIGNAL LOSS IN FE3O4 AND GAMMA-FE2O3 THIN-FILM DISKS [J].

TERADA, A ;

ISHII, O ;

KOBAYASHI, K .

IEEE TRANSACTIONS ON MAGNETICS, 1983, 19 (01) :12-19

[10] WEAR-RESISTANCE AND SIGNAL-TO-NOISE RATIO IN GAMMA-FE2O3 THIN-FILM DISKS [J].

TERADA, A ;

ISHII, O ;

OHTA, S .

IEEE TRANSACTIONS ON MAGNETICS, 1985, 21 (05) :1521-1523

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