VUV REFLECTIVITY OF CRYSTALLINE ALPHA-SIO2 AND OF AMORPHOUS SIO2

被引：9

作者：

BOSIO, C

CZAJA, W

MERTINS, HC

机构：

[1] RCA CORP,PAUL SCHERRER INST,CH-8048 ZURICH,SWITZERLAND

[2] TECH UNIV BERLIN,INST FESTKORPERPHYS,W-1000 BERLIN,GERMANY

来源：

EUROPHYSICS LETTERS | 1992年 / 18卷 / 4BIS期

关键词：

ELECTRON ENERGY STATES IN AMORPHOUS AND GLASSY SOLIDS; OPTICAL PROPERTIES OF BULK MATERIALS;

D O I：

10.1209/0295-5075/18/4/007

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Newly measured reflectivity data of crystalline a-SiO2 show better resolved features, a new fine structure, a dependence on polarisation of the incoming radiation and a clearly visible plasma edge. A first analysis of these data is presented. The reflectivity of amorphous SiO2 is quantitatively different. There is no dependence on polarisation of the incoming radiation and all features are less sharply defined. Finally, the Kramers-Kronig transformed reflectivity data of a-SiO2 coincide well with earlier transmission measurements.

引用

页码：319 / 324

页数：6

共 11 条

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