STUDY OF MICROSTRUCTURE OF EPITAXIAL FULLERENES FILMS

被引：7

作者：

ZHAO, WB ^{[1
]}

ZHANG, XD ^{[1
]}

YE, ZY ^{[1
]}

ZHANG, JL ^{[1
]}

LI, CY ^{[1
]}

YIN, DL ^{[1
]}

GU, ZN ^{[1
]}

ZHOU, XH ^{[1
]}

JIN, ZX ^{[1
]}

机构：

[1] BEIJING UNIV,DEPT CHEM,BEIJING 100871,PEOPLES R CHINA

来源：

THIN SOLID FILMS | 1994年 / 240卷 / 1-2期

基金：

中国国家自然科学基金;

关键词：

D O I：

10.1016/0040-6090(94)90687-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A comprehensive study was made on the structure of epitaxial thin films of C60 and C70 by means of transmission electron microscopy. Both the films show similar face-centered cubic structure and are epitaxial on (001) mica with close-packed plane parallel to the substrate surface. Two main kinds of defects-stacking faults and twins-were observed and are discussed. The effect of the remaining C70 impurity on the crystal orientation of C60 films was studied by comparing different samples made from high-purity fullerene and C60/C70 mixtures. The results show that there is a higher density of planar defects in the films containing larger amounts of impurities: moreover, some faint anomalous reflections located at so-called 2a0 fcc reciprocal lattice points were also detected, probably as a result of C70 contamination. Finally, it is found that stacking disorders can be easily increased by keeping the high-quality pure C60 film in air at room temperature for a few weeks, implying the instability of the crystal orientation of the epitaxial fullerene films.

引用

页码：14 / 21

页数：8

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