SPATIAL-RESOLUTION FOR COMPOSITIONAL ANALYSIS IN STEM

被引：11

作者：

FRIES, E ^{[1
]}

IMESON, D ^{[1
]}

GARRATTREED, AJ ^{[1
]}

VANDERSANDE, JB ^{[1
]}

机构：

[1] MIT,DEPT MAT SCI & ENGN,CAMBRIDGE,MA 02139

来源：

关键词：

D O I：

10.1016/0304-3991(82)90215-7

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：295 / 302

页数：8

共 3 条

[1] QUANTITATIVE-ANALYSIS OF THIN SPECIMENS
CLIFF, G
LORIMER, GW
[J]. JOURNAL OF MICROSCOPY-OXFORD, 1975, 103 (MAR): : 203 - 207
[2] Goldstein J. I., 1977, Proceedings of the 10th Annual Scanning Electron Microscopy Symposium, P315
[3] ON PRODUCING HIGH-SPATIAL-RESOLUTION COMPOSITION PROFILES VIA SCANNING-TRANSMISSION ELECTRON-MICROSCOPY
HALL, EL
IMESON, D
VANDERSANDE, JB
[J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (06): : 1569 - 1585