NONDESTRUCTIVE SCREENING FOR LOW-VOLTAGE FAILURE IN MULTILAYER CERAMIC CAPACITORS

被引：3

作者：

CHITTICK, RC

GRAY, E

ALEXANDER, JH

DRAKE, MP

BUSH, EL

机构：

来源：

IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY | 1983年 / 6卷 / 04期

关键词：

D O I：

10.1109/TCHMT.1983.1136221

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：510 / 516

页数：7

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