HOLOGRAM INTERFEROMETRY - IDENTIFICATION OF SIGN OF SURFACE DISPLACEMENTS

被引：1

作者：

HARIHARAN, P ^{[1
]}

机构：

[1] CSIRO,NATL MEASUREMENT LAB,TOWNSVILLE,AUSTRALIA

来源：

OPTICA ACTA | 1977年 / 24卷 / 09期

关键词：

D O I：

10.1080/713819658

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：989 / &

共 5 条

[1] SANDWICH HOLOGRAM INTERFEROMETRY .2. SOME PRACTICAL CALCULATIONS
ABRAMSON, N
[J]. APPLIED OPTICS, 1975, 14 (04): : 981 - 984
[2] SIGN DETERMINATION OF CONTOUR LINES
BENOIT, P
MATHIEU, E
THOMAS, A
[J]. OPTICS COMMUNICATIONS, 1975, 15 (03) : 392 - 395
[3] NEW APPLICATIONS OF PHOTOGRAPHIC MATERIALS IN SCIENCE AND TECHNIQUE
BUSCHMANN, HT
DEML, R
DUVILLE, R
PHILIPPAERTS, H
BOLLEN, R
RANZ, E
[J]. APPLIED PHYSICS, 1976, 9 (02): : 85 - 104
[4] COLLIER RJ, 1971, OPTICAL HOLOGRAPHY, P418
[5] 2-HOLOGRAM INTERFEROMETRY - SIMPLIFIED SANDWICH TECHNIQUE
HARIHARAN, P
HEGEDUS, ZS
[J]. APPLIED OPTICS, 1976, 15 (04): : 848 - 849