IR SPECTROSCOPY OF POROUS SILICA-GELS

被引：8

作者：

HORNFECK, M ^{[1
]}

THEISS, W ^{[1
]}

CLASEN, R ^{[1
]}

机构：

[1] PHILIPS GMBH,RES LABS,W-5100 AACHEN,GERMANY

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1992年 / 145卷 / 1-3期

关键词：

D O I：

10.1016/S0022-3093(05)80447-8

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

IR spectroscopy is a well established tool in chemical and semiconductor industry giving information about the composition and geometry (film thickness) of the samples. The application of this non-destructive method to characterize porous silica gels obviously faces the problem of dealing with inhomogeneities. The samples are basically two-component systems of SiO2 and air (or vacuum). A rather simple theoretical model is presented being able to describe the effects of the inhomogeneities and to fit experimental spectra quite well. It gives information about the volume fraction and the strength of the SiO2 network.

引用

页码：154 / 158

页数：5

共 11 条

[1]

BERGMAN D, 1985, METHODES HOMOGENISAT

[2] Calculation of various physics constants in heterogenous substances I Dielectricity constants and conductivity of mixed bodies from isotropic substances [J].