ELECTRONIC-STRUCTURE OF VACANCIES IN AMORPHOUS-SILICON

被引:19
作者
KIM, E [1 ]
LEE, YH [1 ]
机构
[1] JEONBUK NATL UNIV,SEMICOND PHYS RES CTR,CHONJU 560756,SOUTH KOREA
来源
PHYSICAL REVIEW B | 1995年 / 51卷 / 08期
关键词
D O I
10.1103/PhysRevB.51.5429
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The electronic structures of vacancies in amorphous silicon are studied by a tight-binding total-energy-minimization scheme. The most salient feature in the electronic structure is that deep gap states originating from the vacancies disappear in amorphous silicon while sustaining the vacant volume in most cases, unlike the vacancies in crystalline silicon. The origin of the disappearance of the deep gap states is explained by the relaxation of the neighboring atoms near the vacancy to enhance the strong p bonding character which gives large bonding-antibonding splitting, and sp2+p bonding character where p states mostly contribute to the conduction bands. © 1995 The American Physical Society.
引用
收藏
页码:5429 / 5432
页数:4
相关论文
共 18 条
[1]  
BISWAS R, 1989, PHYS REV LETT, V63, P149
[2]   GENERATING TRANSFERABLE TIGHT-BINDING PARAMETERS - APPLICATION TO SILICON [J].
GOODWIN, L ;
SKINNER, AJ ;
PETTIFOR, DG .
EUROPHYSICS LETTERS, 1989, 9 (07) :701-706
[3]   ELECTRONIC PROPERTIES OF COMPLEX CRYSTALLINE AND AMORPHOUS PHASES OF GE AND SI .1. DENSITY OF STATES AND BAND STRUCTURES [J].
JOANNOPOULOS, JD ;
COHEN, ML .
PHYSICAL REVIEW B, 1973, 7 (06) :2644-2657
[4]   STRUCTURAL, ELECTRONIC, AND VIBRATIONAL PROPERTIES OF LIQUID AND AMORPHOUS-SILICON - TIGHT-BINDING MOLECULAR-DYNAMICS APPROACH [J].
KIM, E ;
LEE, YH .
PHYSICAL REVIEW B, 1994, 49 (03) :1743-1749
[5]   A TIGHT-BINDING MOLECULAR-DYNAMICS STUDY OF THE EQUILIBRIUM STRUCTURES OF SMALL SI CLUSTERS [J].
LEE, IH ;
CHANG, KJ ;
LEE, YH .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1994, 6 (03) :741-750
[6]  
Lee S. A., UNPUB
[7]   X-RAY PHOTOEMISSION SPECTRA OF CRYSTALLINE AND AMORPHOUS SI AND GE VALENCE BANDS [J].
LEY, L ;
SHIRLEY, DA ;
POLLAK, R ;
KOWALCZYK, S .
PHYSICAL REVIEW LETTERS, 1972, 29 (16) :1088-+
[8]   STABILITY OF VACANCIES IN AMORPHOUS-SILICON [J].
LUTZ, R ;
LEWIS, LJ .
PHYSICAL REVIEW B, 1993, 47 (15) :9896-9899
[9]   ELECTRONIC-STRUCTURE OF SI(100)C(4X2) CALCULATED WITHIN THE GW APPROXIMATION [J].
NORTHRUP, JE .
PHYSICAL REVIEW B, 1993, 47 (15) :10032-10035
[10]   DEFECTS IN AMORPHOUS-SILICON - A NEW PERSPECTIVE [J].
PANTELIDES, ST .
PHYSICAL REVIEW LETTERS, 1986, 57 (23) :2979-2982