DESIGN CONSIDERATION IN AN ULTRAFAST SCANNING TUNNELING MICROSCOPE

被引：9

作者：

BOTKIN, D ^{[1
]}

WEISS, S ^{[1
]}

OGLETREE, DF ^{[1
]}

BEEMAN, J ^{[1
]}

SALMERON, M ^{[1
]}

CHEMLA, DS ^{[1
]}

机构：

[1] UNIV CALIF BERKELEY,LAWRENCE BERKELEY LAB,DIV MAT SCI,BERKELEY,CA 94720

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1995年 / 66卷 / 08期

关键词：

D O I：

10.1063/1.1145359

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We describe an ultrafast scanning tunneling microscope (USTM) with picosecond temporal resolution. We present results of single-point ultrafast tunneling measurements and outline some of the methods and pitfalls in USTM. Ultimately, the technique has the potential to create picosecond scale movies of surface phenomena with atomic spatial resolution. (C) 1995 American Institute of Physics.

引用

页码：4130 / 4134

页数：5

共 26 条

[1] MICROFABRICATION OF CANTILEVER STYLI FOR THE ATOMIC FORCE MICROSCOPE [J].

ALBRECHT, TR ;

AKAMINE, S ;

CARVER, TE ;

QUATE, CF .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04) :3386-3396

[2]

BINNIG G, 1986, SURF SCI, V169, pL295, DOI 10.1016/0039-6028(86)90596-0

[3]

BINNIG G, 1982, HELV PHYS ACTA, V55, P726

[4] SINGLE-TUBE 3-DIMENSIONAL SCANNER FOR SCANNING TUNNELING MICROSCOPY [J].

BINNIG, G ;

SMITH, DPE .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (08) :1688-1689

[5]

BOTKIN D, 1994, P SOC PHOTO-OPT INS, V2116, P376, DOI 10.1117/12.175874

[6]

BOTKIN DB, IN PRESS

[7] TRAVERSAL TIME FOR TUNNELING [J].

BUTTIKER, M ;

LANDAUER, R .

IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (05) :451-454

[8] SUBPICOSECOND TIME-RESOLVED COHERENT-PHONON OSCILLATIONS IN GAAS [J].

CHO, GC ;

KUTT, W ;

KURZ, H .

PHYSICAL REVIEW LETTERS, 1990, 65 (06) :764-766

[9] SCANNING-TUNNELING-MICROSCOPY STUDY OF THE SURFACE-DIFFUSION OF SULFUR ON RE(0001) [J].

DUNPHY, JC ;

SAUTET, P ;

OGLETREE, DF ;

DABBOUSI, O ;

SALMERON, MB .

PHYSICAL REVIEW B, 1993, 47 (04) :2320-2328

[10] RAPID PROGRAMMABLE 300 PS OPTICAL DELAY SCANNER AND SIGNAL-AVERAGING SYSTEM FOR ULTRAFAST MEASUREMENTS [J].

EDELSTEIN, DC ;

ROMNEY, RB ;

SCHEUERMANN, M .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1991, 62 (03) :579-583

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