FRINGE INTERPOLATION BY 2-REFERENCE-BEAM HOLOGRAPHIC-INTERFEROMETRY - REDUCING SENSITIVITY TO HOLOGRAM MISALIGNMENT

被引：59

作者：

DANDLIKER, R

THALMANN, R

WILLEMIN, JF

机构：

来源：

关键词：

D O I：

10.1016/0030-4018(82)90236-X

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：301 / 306

页数：6

共 7 条

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WHITE, AD
BRANGACCIO, DJ
[J]. APPLIED OPTICS, 1974, 13 (11) : 2693 - 2703
[2] 2-REFERENCE-BEAM HOLOGRAPHIC INTERFEROMETRY
DANDLIKER, R
MAROM, E
MOTTIER, FM
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1976, 66 (01) : 23 - 30
[3] Dandliker R., 1977, Applications of Holography and Optical Data Processing, P169
[4] Dandliker R., 1980, PROGR OPTICS, V17, P1
[5] OPTICAL-PHASE MEASUREMENT IN REAL-TIME
FRANTZ, LM
SAWCHUK, AA
OHE, WVD
[J]. APPLIED OPTICS, 1979, 18 (19): : 3301 - 3306
[6] LANZL F, 1977, SPIE, V136, P166
[7] DOUBLE-EXPOSURE HOLOGRAPHIC-INTERFEROMETRY USING COMMON-PATH REFERENCE WAVES
SOMMARGREN, GE
[J]. APPLIED OPTICS, 1977, 16 (06) : 1736 - 1741