HIGH-RESOLUTION IMAGING PROPERTIES OF STEM

被引：11

作者：

BECK, V

CREWE, AV

机构：

[1] UNIV CHICAGO,ENRICO FERMI INST,CHICAGO,IL 60637

[2] UNIV CHICAGO,DEPT PHYS,CHICAGO,IL 60637

[3] UNIV CHICAGO,DEPT BIOPHYS,CHICAGO,IL 60637

来源：

关键词：

Compendex;

D O I：

10.1016/S0304-3991(75)80016-7

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Microscopes, Electron

引用

页码：137 / 144

页数：8

共 16 条

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[2]

BECK V, 1974, 32ND P AN M EMSA, P426

BLACK, G ;

LINFOOT, EH .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1957, 239 (1219) :522-540

[4]

BORN M, 1965, PRINCIPLES OPTICS, P459

[5]

BORN M, 1965, PRINCIPLES OPTICS, P462

[6]

BORN M, 1965, PRINCIPLES OPTICS, P435

[7]

GOODMAN JW, 1968, INTRO FOURIER OPTICS, P101

[8]

ISAACSON M, 1974, OPTIK, V41, P92

[9]

LENZ F, 1954, Z NATURFORSCH A, V9, P185

[10]

MESSIAH A, 1958, QUANTUM MECHANICS, P133