AUGER ANALYSIS OF THIN OXIDE-FILMS ON PB-IN ALLOYS

被引：29

作者：

CHOU, NJ

LAHIRI, SK

HAMMER, R

KOMAREK, KL

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598

[2] UNIV VIENNA,VIENNA,AUSTRIA

来源：

JOURNAL OF CHEMICAL PHYSICS | 1975年 / 63卷 / 06期

关键词：

D O I：

10.1063/1.431628

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：2758 / 2764

页数：7

共 17 条

[1] ELECTRICAL CONDUCTIVITY AND THERMOELECTRIC POWER OF INDIUM OXIDE [J].

ARVIN, MJ .

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1962, 23 (11) :1681-&

[2] AUGER-ELECTRON SPECTROSCOPY STUDY OF SURFACE COMPOSITION OF LEAD-INDIUM SYSTEM [J].

BERGLUND, S ;

SOMORJAI, GA .

JOURNAL OF CHEMICAL PHYSICS, 1973, 59 (10) :5537-5545

[3]

Bird R. J., 1973, Metal Science Journal, V7, P109

[4] ESTIMATES OF EFFICIENCIES OF PRODUCTION AND DETECTION OF ELECTRON-EXCITED AUGER EMISSION [J].

BISHOP, HE ;

RIVIERE, JC .

JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) :1740-&

[5]

Chou N. J., 1973, Journal of Electronic Materials, V2, P115, DOI 10.1007/BF02658106

[6]

CHOU NJ, TO BE PUBLISHED

[7]

COUGHLIN JP, 1954, 542 BUR MIN B

[8] ANALYSIS OF ULTRATHIN OXIDE GROWTH ON INDIUM [J].

ELDRIDGE, JM ;

VANDERME.YJ ;

DONG, DW .

THIN SOLID FILMS, 1972, 12 (02) :447-&

[9]

ELDRIDGE JM, TO BE PUBLISHED

[10]

Grove A S, 1967, PHYS TECHNOLOGY SEMI

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