DE-CORRELATION EFFECTS IN SPECKLE-PATTERN INTERFEROMETRY .1. WAVELENGTH CHANGE DEPENDENT DE-CORRELATION WITH APPLICATION TO CONTOURING AND SURFACE-ROUGHNESS MEASUREMENT

被引：33

作者：

WYKES, C ^{[1
]}

机构：

[1] LOUGHBOROUGH UNIV TECHNOL,DEPT MECH ENGN,LOUGHBOROUGH LE11 3TU,LEICESTERSHIRE,ENGLAND

来源：

OPTICA ACTA | 1977年 / 24卷 / 05期

关键词：

D O I：

10.1080/716099422

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

收藏

页码：517 / 532

页数：16

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