STUDY OF MAGNETIC CHARACTERISTICS OF TIPS FOR MAGNETIC FORCE MICROSCOPY

被引：7

作者：

SUEOKA, K ^{[1
]}

SAI, F ^{[1
]}

PARKER, K ^{[1
]}

ARNOLDUSSEN, T ^{[1
]}

机构：

[1] ADSTAR,SAN JOSE,CA 95193

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1994年 / 12卷 / 03期

关键词：

D O I：

10.1116/1.587245

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The magnetic characteristics of magnetic force microscopy (MFM) tips were studied by using several methods with a Lorentz transmission electron microscope a magnetoresistive head, and a thin-film inductive head. The results obtained indicate that high-resolution observation with little disturbance of the sample's magnetic state can be achieved by using a CoPtCr-coated MFM tip.

引用

页码：1618 / 1622

页数：5

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