EXPERT-SYSTEM FOR THE VOLTAMMETRIC DETERMINATION OF TRACE-METALS .3. METHODS FOR DETERMINING MERCURY, SELENIUM AND VANADIUM

被引:11
作者
ESTEBAN, M [1 ]
ARINO, C [1 ]
RUISANCHEZ, I [1 ]
LARRECHI, MS [1 ]
RIUS, FX [1 ]
机构
[1] UNIV ROVIRA & VIRGILI TARRAGONA,DEPT QUIM,E-43005 TARRAGONA,SPAIN
关键词
VOLTAMMETRY; EXPERT SYSTEM; MERCURY; SELENIUM; VANADIUM; TRACE METALS; CHEMOMETRICS;
D O I
10.1016/0003-2670(93)85329-I
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
A previously described expert system for the voltammetric determination of Cu, Zn, Cd, Pb, In, Ni, Co and Tl is enhanced and improved by means of the addition of methods for Hg, V and Se (optionally also Te). Special attention is paid to the determination of V, inside a wide concentration range, in different types of samples. The system guides the user in the choice of sample treatment and the most appropriate voltammetric procedure for the identification and the quantification of the trace metals. The techniques implemented are differential pulse polarography, anodic stripping voltammetry, cathodic stripping voltammetry and adsorptive stripping voltammetry, using mercury drop electrodes and a gold electrode (for the determination of Hg). For the identification and resolution of overlapping peaks (Cd and In), the system may call two external programs, written in turboBasic. Quantification is carried out by means of the multiple standard addition method, and the quality of the calibration plot is tested by several statistical validation tests. The expert system is developed using KES (knowledge engineering system).
引用
收藏
页码:435 / 443
页数:9
相关论文
共 24 条
[1]  
AHMED R, 1981, MIKROCHIM ACTA, V1, P171, DOI 10.1007/BF01196387
[2]  
BROWETT WR, 1989, ACS SYM SER, V408, P210
[3]  
CHAUMERY C, 1985, ANN FALSIF EXP CHIM, V78, P161
[4]   EXPERT SYSTEM FOR THE VOLTAMMETRIC DETERMINATION OF TRACE-METALS .1. DETERMINATION OF COPPER, ZINC, CADMIUM, LEAD AND INDIUM [J].
ESTEBAN, M ;
RUISANCHEZ, I ;
LARRECHI, MS ;
RIUS, FX .
ANALYTICA CHIMICA ACTA, 1992, 268 (01) :95-105
[5]   EXPERT SYSTEM FOR THE VOLTAMMETRIC DETERMINATION OF TRACE-METALS .2. METHODS FOR DETERMINING NICKEL, COBALT AND THALLIUM AT DIFFERENT CONCENTRATION RATIOS [J].
ESTEBAN, M ;
RUISANCHEZ, I ;
LARRECHI, MS ;
RIUS, FX .
ANALYTICA CHIMICA ACTA, 1992, 268 (01) :107-114
[6]  
ESTEBAN M, 1992, TRENDS ANAL CHEM, V11, P135
[7]  
GILBERT DD, 1965, ANAL CHEM, V337, P1102
[8]  
HENZE G, 1979, FRESEN Z ANAL CHEM, V295, P1
[9]   EVALUATION OF ENERGY-DISPERSIVE X-RAY-SPECTRA WITH THE AID OF EXPERT SYSTEMS [J].
JANSSENS, K ;
VANESPEN, P .
ANALYTICA CHIMICA ACTA, 1986, 191 :169-180
[10]   A SMALL EXPERT SYSTEM FOR SOLID-PHASE EXTRACTION [J].
MOORS, M ;
MASSART, DL .
TRAC-TRENDS IN ANALYTICAL CHEMISTRY, 1990, 9 (05) :164-169