DIGITAL PHASE-STEPPING INTERFEROMETRY - EFFECTS OF MULTIPLY REFLECTED BEAMS

[1] DIGITAL WAVEFRONT MEASURING INTERFEROMETER FOR TESTING OPTICAL SURFACES AND LENSES [J]. APPLIED OPTICS, 1974, 13 (11) : 2693 - 2703

[2] PHASE-SHIFTER CALIBRATION IN PHASE-SHIFTING INTERFEROMETRY [J]. APPLIED OPTICS, 1985, 24 (18): : 3049 - 3052

[3] DORBAND B, 1982, OPTIK, V60, P161

[4] OPTICAL-PHASE MEASUREMENT IN REAL-TIME [J]. APPLIED OPTICS, 1979, 18 (19): : 3301 - 3306

[5] Grosso R. P., 1979, Proceedings of the Society of Photo-Optical Instrumentation Engineers, V192, P65

[6] HIGH-PRECISION DIGITAL INTERFEROMETRY - ITS APPLICATION TO THE PRODUCTION OF AN ULTRATHIN SOLID FABRY-PEROT ETALON [J]. OPTICAL ENGINEERING, 1984, 23 (03) : 294 - 297

[7] HARIHARAN P, 1985, OPTICAL INTERFEROMET, P63

[8] SCHAHAM M, 1981, P SOC PHOTO-OPT INST, V306, P183

[9] DIGITAL WAVE-FRONT MEASURING INTERFEROMETRY - SOME SYSTEMATIC-ERROR SOURCES [J]. APPLIED OPTICS, 1983, 22 (21) : 3421 - 3432

[10] USE OF AN AC HETERODYNE LATERAL SHEAR INTERFEROMETER WITH REAL-TIME WAVEFRONT CORRECTION SYSTEMS [J]. APPLIED OPTICS, 1975, 14 (11) : 2622 - 2626

[1] DIGITAL WAVEFRONT MEASURING INTERFEROMETER FOR TESTING OPTICAL SURFACES AND LENSES [J]. APPLIED OPTICS, 1974, 13 (11) : 2693 - 2703

[2] PHASE-SHIFTER CALIBRATION IN PHASE-SHIFTING INTERFEROMETRY [J]. APPLIED OPTICS, 1985, 24 (18): : 3049 - 3052

[3] DORBAND B, 1982, OPTIK, V60, P161

[4] OPTICAL-PHASE MEASUREMENT IN REAL-TIME [J]. APPLIED OPTICS, 1979, 18 (19): : 3301 - 3306

[5] Grosso R. P., 1979, Proceedings of the Society of Photo-Optical Instrumentation Engineers, V192, P65

[6] HIGH-PRECISION DIGITAL INTERFEROMETRY - ITS APPLICATION TO THE PRODUCTION OF AN ULTRATHIN SOLID FABRY-PEROT ETALON [J]. OPTICAL ENGINEERING, 1984, 23 (03) : 294 - 297

[7] HARIHARAN P, 1985, OPTICAL INTERFEROMET, P63

[8] SCHAHAM M, 1981, P SOC PHOTO-OPT INST, V306, P183

[9] DIGITAL WAVE-FRONT MEASURING INTERFEROMETRY - SOME SYSTEMATIC-ERROR SOURCES [J]. APPLIED OPTICS, 1983, 22 (21) : 3421 - 3432

[10] USE OF AN AC HETERODYNE LATERAL SHEAR INTERFEROMETER WITH REAL-TIME WAVEFRONT CORRECTION SYSTEMS [J]. APPLIED OPTICS, 1975, 14 (11) : 2622 - 2626