STRUCTURAL RELAXATIONS IN AMORPHOUS BIPHENYL - RAMAN-SPECTROSCOPIC STUDIES

被引:16
作者
ISHII, K
NAKAYAMA, H
TANABE, K
KAWAHARA, M
机构
[1] Department of Chemistry, Gakushuin University, Toshimaku, Tokyo, 171
关键词
D O I
10.1016/0009-2614(92)90078-2
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Amorphous biphenyl films were prepared by vacuum evaporation onto cold metal substrates. Structural relaxations (SR) in the films were studied by in situ Raman measurements during annealing. Biphenyl molecules are twisted in the initial amorphous state as in the molten state. A gradual SR which causes increases in Raman-band intensities starts around 20 K. An abrupt SR occurs around 140 K irrespective of the initial temperature of the film preparation. These features of SR are discussed in comparison with those in amorphous p-ter-phenyl.
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页码:236 / 240
页数:5
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