A CROSSED ELECTRIC-MAGNETIC FIELD ELECTRON-CAPTURE ION-SOURCE

被引：11

作者：

DELMORE, JE

机构：

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1983年 / 51卷 / 2-3期

关键词：

D O I：

10.1016/0020-7381(83)85005-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

引用

页码：191 / 205

页数：15

共 14 条

[1] LINE-SHAPES FOR ATTACHMENT OF THRESHOLD ELECTRONS TO SF6 AND CFCL3 - THRESHOLD PHOTOELECTRON (TPSA) STUDIES OF XE, CO, AND C2H2
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[2] A new mass spectrometer with improved focusing properties
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Hipple, JA
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CHRISTODOULIDES, AA
CHRISTOPHOROU, LG
PAI, RY
TUNG, CM
[J]. JOURNAL OF CHEMICAL PHYSICS, 1979, 70 (03) : 1156 - 1168
[4] CROSS SECTIONS FOR ELECTRON ATTACHMENT RESONANCES PEAKING AT SUBTHERMAL ENERGIES
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MCCORKLE, DL
CARTER, JG
[J]. JOURNAL OF CHEMICAL PHYSICS, 1971, 54 (01) : 253 - &
[5] CALCULATION OF SF6-/SF6 AND CL-/CFCL3 ELECTRON-ATTACHMENT CROSS-SECTIONS IN THE ENERGY-RANGE 0-100 MEV
CHUTJIAN, A
[J]. JOURNAL OF PHYSICAL CHEMISTRY, 1982, 86 (18) : 3518 - 3521
[6] EXPERIMENTAL SF6-SF6 AND CL-CFCL3 ELECTRON-ATTACHMENT CROSS-SECTIONS IN THE ENERGY-RANGE 0-200 MEV
CHUTJIAN, A
[J]. PHYSICAL REVIEW LETTERS, 1981, 46 (23) : 1511 - 1514
[7] DEKKER AJ, SOLID STATE PHYSICS
[8] NEGATIVE-ION FORMATION FROM SF6 ON HOT SURFACES
DELMORE, JE
[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1982, 43 (01): : 71 - 78
[9] ISOTOPIC ANALYSIS OF IODINE USING NEGATIVE SURFACE-IONIZATION
DELMORE, JE
[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1982, 43 (04): : 273 - 281
[10] IMPROVED CATAPHORETIC DEPOSITION METHODS FOR LANTHANUM HEXABORIDE
DELMORE, JE
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1983, 54 (02) : 158 - 160

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