HELIUM FIELD-ION MICROSCOPY OF HEXAGONAL CLOSE-PACKED METALS

被引：18

作者：

MELMED, AJ

机构：

来源：

SURFACE SCIENCE | 1967年 / 8卷 / 1-2期

关键词：

D O I：

10.1016/0039-6028(67)90081-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

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页码：191 / &

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