OBSERVATION OF NEEL STRUCTURE WALLS ON THE SURFACE OF 1.4-MU-M-THICK MAGNETIC-FILMS USING SPIN-POLARIZED SCANNING ELECTRON-MICROSCOPY

被引:15
作者
KOIKE, K
MATSUYAMA, H
HAYAKAWA, K
MITSUOKA, K
NARISHIGE, S
SUGITA, Y
SHIIKI, K
SAKA, C
机构
[1] HITACHI LTD, CENT RES LAB, KOKUBUNJI, TOKYO 185, JAPAN
[2] HITACHI LTD, HITACHI RES LAB, HITACHI, IBARAKI 31912, JAPAN
关键词
D O I
10.1063/1.97502
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:980 / 981
页数:2
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