PREPARATION OF MGIN2O4-X THIN-FILMS ON GLASS SUBSTRATE BY RF-SPUTTERING
被引:62
作者:
UNNO, H
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机构:TOKYO INST TECHNOL, ENGN MAT RES LAB, MIDORI KU, YOKOHAMA, KANAGAWA 227, JAPAN
UNNO, H
HIKUMA, N
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机构:TOKYO INST TECHNOL, ENGN MAT RES LAB, MIDORI KU, YOKOHAMA, KANAGAWA 227, JAPAN
HIKUMA, N
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机构:
OMATA, T
UEDA, N
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机构:TOKYO INST TECHNOL, ENGN MAT RES LAB, MIDORI KU, YOKOHAMA, KANAGAWA 227, JAPAN
UEDA, N
HASHIMOTO, T
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机构:TOKYO INST TECHNOL, ENGN MAT RES LAB, MIDORI KU, YOKOHAMA, KANAGAWA 227, JAPAN
HASHIMOTO, T
KAWAZOE, H
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机构:TOKYO INST TECHNOL, ENGN MAT RES LAB, MIDORI KU, YOKOHAMA, KANAGAWA 227, JAPAN
KAWAZOE, H
机构:
[1] TOKYO INST TECHNOL, ENGN MAT RES LAB, MIDORI KU, YOKOHAMA, KANAGAWA 227, JAPAN
[2] INST MOLEC SCI, OKAZAKI 444, JAPAN
来源:
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS
|
1993年
/
32卷
/
9A期
关键词:
MGLN2O4-X THIN FILM;
NEW TRANSPARENT CONDUCTOR;
RF SPUTTERING;
WIDE BAND GAP (SIMILAR-TO-34 EV);
HIGH CONDUCTIVITY;
D O I:
10.1143/JJAP.32.L1260
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
MgIn2O4-X thin films were deposited onto a silica glass plate by the RF sputtering method. The highest conductivity observed for the film post-annealed under H-2 flow was 2.3 x 10(2) S/CM, With a carrier concentration of 6.3 x 10(20) CM-3 and a mobility of 2.2 cm2.V-1.s-1. No distinct optical absorption band was observed in the visible region.