SPECIMEN CONTAMINATION IN ELECTRON-PROBE MICROANALYSIS AND ITS PREVENTION USING A COLD TRAP

被引：10

作者：

RANZETTA, GV

SCOTT, VD

机构：

来源：

JOURNAL OF SCIENTIFIC INSTRUMENTS | 1966年 / 43卷 / 11期

关键词：

D O I：

10.1088/0950-7671/43/11/307

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：816 / &

共 6 条

[1]

CAMPBELL AJ, 1966, ELECTRON MICROPROBE, P77

[2]

CASTAING R, 1954, CR HEBD ACAD SCI, V238, P1506

[3] THE ORIGIN OF SPECIMEN CONTAMINATION IN THE ELECTRON MICROSCOPE [J].

ENNOS, AE .

BRITISH JOURNAL OF APPLIED PHYSICS, 1953, 4 (APR) :101-106

[4]

ENNOS AE, 1954, BRIT J APPL PHYS, V5, P28

[5] ELECTRON-OPTICAL DESIGN OF AN X-RAY MICRO-ANALYSER [J].

MULVEY, T .

JOURNAL OF SCIENTIFIC INSTRUMENTS, 1959, 36 (08) :350-355

[6] ELECTRON-PROBE MICROANALYSIS OF LOW ATOMIC NUMBER ELEMENTS [J].

RANZETTA, GV ;

SCOTT, VD .

BRITISH JOURNAL OF APPLIED PHYSICS, 1964, 15 (03) :263-&