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APPLICATION OF THEORY OF KUBELKA AND MUNK TO DENSITOMETRY .2. SIMULTANEOUS REFLECTANCE AND TRANSMITTANCE DENSITOMETRY

被引：5
作者：
HUF, FA [1 ]
机构：
[1] STATE UNIV LEIDEN,DEPT PHARMACEUT ANAL & ANALYT CHEM,GORLAEUS LAB,LEIDEN,NETHERLANDS
来源：
ANALYTICA CHIMICA ACTA | 1977年 / 90卷 / MAY期
关键词：
D O I：
10.1016/S0003-2670(01)82303-5
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：143 / 150
页数：8
相关论文
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[3]   INFLUENCE ON REFLECTANCE MEASUREMENTS OF THIN-LAYER CHROMATOGRAMS BY TECHNICAL FACTORS .3. FACTORS INFLUENCING SIMULTANEOUS MEASUREMENTS [J].
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[4]  
Schute J B, 1970, Pharm Weekbl, V105, P1025
[5]   STANDARDIZATION OF DIRECT SPECTROPHOTOMETRIC EVALUATION OF CHROMATOGRAMS .2. NEW FUNCTION FOR PHOTOMETRY [J].
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[7]   DEVELOPMENT AND PRACTICAL UTILIZATION OF A LINEAR SPECTRODENSITOMETER [J].
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[8]   STANDARDISATION OF DIRECT SPECTROPHOTOMETRIC QUANTITATIVE ANALYSIS OF CHROMATOGRAMS .1. SIMULTANEOUS TRANSMITTANCE AND REFLECTANCE MEASUREMENTS [J].
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